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Trabalho de evento-resumo
Focal spot measurements using CCD sensor with a dedicate software to quality control programs (2000)
Nersissian, Denise Yanikian; Pereira, Marco Aurélio Guedes; Furquim, Tânia Aparecida Correia; Costa, Paulo Roberto; Caldas, Linda Viola Ehlin
Source: Proceedings. Conference titles: WORLD CONGRESS ON MEDICAL PHYSICS AND BIOMEDICAL ENGINEERING. Unidade: IEE
Subjects: RADIOLOGIA, MEDICINA FÍSICA, RADIOLOGIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NERSISSIAN, Denise Yanikian et al. Focal spot measurements using CCD sensor with a dedicate software to quality control programs. 2000, Anais.. Chicago: IUPESM/IFMBE/IOMP/AAPM/AIMBE/IEEE-EMB, 2000. . Acesso em: 15 maio 2024.
APA
Nersissian, D. Y., Pereira, M. A. G., Furquim, T. A. C., Costa, P. R., & Caldas, L. V. E. (2000). Focal spot measurements using CCD sensor with a dedicate software to quality control programs. In Proceedings. Chicago: IUPESM/IFMBE/IOMP/AAPM/AIMBE/IEEE-EMB.
NLM
Nersissian DY, Pereira MAG, Furquim TAC, Costa PR, Caldas LVE. Focal spot measurements using CCD sensor with a dedicate software to quality control programs. Proceedings. 2000 ;[citado 2024 maio 15 ]
Vancouver
Nersissian DY, Pereira MAG, Furquim TAC, Costa PR, Caldas LVE. Focal spot measurements using CCD sensor with a dedicate software to quality control programs. Proceedings. 2000 ;[citado 2024 maio 15 ]
Trabalho de evento-resumo
Radiographic analysis of a X-Ray semiconductor detector with digital sensor for the determination of its efficiency (2000)
Silva, Marcia Carvalho; Herdade, Silvio Bruni; Nersissian, Denise Yanikian; Pereira, Marco Aurélio Guedes; Costa, Paulo Roberto; Terini, Ricardo Andrade
Source: Proceedings. Conference titles: WORLD CONGRESS ON MEDICAL PHYSICS AND BIOMEDICAL ENGINEERING. Unidades: IF, IEE
Assunto: RADIOLOGIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SILVA, Marcia Carvalho et al. Radiographic analysis of a X-Ray semiconductor detector with digital sensor for the determination of its efficiency. 2000, Anais.. Chicago: IUPESM/IFMBE/IOMP/AAPM/AIMBE/IEEE-EMB, 2000. . Acesso em: 15 maio 2024.
APA
Silva, M. C., Herdade, S. B., Nersissian, D. Y., Pereira, M. A. G., Costa, P. R., & Terini, R. A. (2000). Radiographic analysis of a X-Ray semiconductor detector with digital sensor for the determination of its efficiency. In Proceedings. Chicago: IUPESM/IFMBE/IOMP/AAPM/AIMBE/IEEE-EMB.
NLM
Silva MC, Herdade SB, Nersissian DY, Pereira MAG, Costa PR, Terini RA. Radiographic analysis of a X-Ray semiconductor detector with digital sensor for the determination of its efficiency. Proceedings. 2000 ;[citado 2024 maio 15 ]
Vancouver
Silva MC, Herdade SB, Nersissian DY, Pereira MAG, Costa PR, Terini RA. Radiographic analysis of a X-Ray semiconductor detector with digital sensor for the determination of its efficiency. Proceedings. 2000 ;[citado 2024 maio 15 ]

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